Program
In this year the EUFN workshop will have a special focus on AUTOMATION
Tentative program:
Wednesday June 7th
09:00 Registration opening
10:00 Tutorial on Automation (Dr. Carsten Putzke, MPSD, MPI Hamburg)
12:00 Lunch break
13:00 Session 1
Coffee Break
15:30 Session 2
Posters & beer (apéro)
Thursday June 8th
08:30 Get together
09:00 Session 3
Coffee Break
11:00 Session 4 –> mini workshop: 3 rounds à 30 min.
Lunch break
14:00 Session 5
Posters & coffee /beer
City tour: https://www.zurichcitytours.ch/english/
19:00 Conference dinner
Friday June 9th
08:30 Get together
09:00 Session 6
Coffee Break
11:00 Session 7
12:40 Closing
Invited Tutorial
Carsten Putzke | MPI Hamburg | Germany
https://www.mpsd.mpg.de/person/114295/633655
Automation in Focused Ion Beam and Scanning Electron Microscopy
Automation of repetitive tasks is a common challenge of many fields in achieving higher productivity and reliability. The particular challenge in fundamental science is the vast variety of different materials and tasks. The combination of both presents an obstacle that requires higher efforts in programming of automated tools. The benefit lies in an enhanced accuracy and the possibility for the user to focus on progress rather than repetition.
In this tutorial we will look into:
- The tools currently available to automation in FIB/SEM.
- The basic requirements for a successful automation and how automation enables automation.
- Obstacles of automation of FIB/SEM in material science.
- Examples of FIB/SEM automation in alignment and processing.
- Live programming and execution of an example in Python.
Invited Speakers
t.b.a.
stay tuned for further updates!