European FIB Network – General
Frank Altmann
Group Manager Diagnostic of Semiconductor Technologies
Center for Applied Microstructure Diagnostics CAM
Fraunhofer Institute for Microstructure of Materials and Systems IMWS
Address: | Walter-Huelse-Strasse 1 | 06120 Halle | Germany |
Tel.: | +49 345 5589-139 |
Fax: | +49 345 5589-101 |
E-mail: | frank.altmann@imws.fraunhofer.de |
Website: | www.imws.fraunhofer.de |
Dr.
Joakim Reuteler
ScopeM – Scientific Center for Optical and Electron Microscopy, ETH Zürich
Address: | Auguste-Piccard-Hof 1 | 8093 Zürich | Switzerland |
Tel.: | +41 44 633 69 91 |
Fax: | +41 44 632 11 32 |
E-mail: | joakim.reuteler@scopem.ethz.ch |
Website: | https://www.scopem.ethz.ch |