Abstract Submission
Based on the EUFN mission we invite all FIB users to present and discuss their results including scientists, engineers and technicians. We kindly ask you to submit your contribution(s) for a presentation at the EUFN Workshop 2019 which includes but is not limited to the following topics:
- Simulation and theory (ion solid interaction, materials degradation, gas assisted deposition, …)
- Instrumentation (new tools, ion sources, detectors, manipulators, navigation, GIS systems, automation/control)
- Correlative Microscopy
- Micromachining
- FIB applications in life science, geoscience and other new fields
- Local characterization and analytics (SIMS/TOF-SIMS, EBSD, …)
- FIBID
- FIB application for failure analysis and circuit edit
- FIB based sample preparation (recipes, best practice) for
- TEM
- XCT
- APT
Please follow our submission guidelines:
- Please use our A5 TEMPLATE for the abstract preparation which also includes style guidelines (Word or PDF) for a common style in the abstract booklet (no further editing from our side will be done).
- Once you have composed your abstract please send it per email to eufn2019@hzdr.de with the email subject “EUFN 2019 Abstract”
- Submit your abstract on March 31st at latest.
- Please keep in mind that the number of available talks is limited so that some oral presentations preferences will be invited for a poster presentation.
Further details:
- You will be notified about the abstract decision till April 29th 2019.
- All presenters are kindly invited to provide a full or stripped-down version of their presentation after the EUFN workshop. They will be uploaded to a password protected sub-page to be available for attendees after the conference.
- Please dont forget to visit our Registration section.